Commercial samples of wheat, rye and potato flour and flaked oats, as well as ground flaked oats and fresh potatoes were gamma-irradiated (20 or 30 kGy dose). The products and appropriate control samples were inves tigated by small-angle X-ray scattering (SAXS) in the range of 28 from 0.357 to 6.46 degree (CuKa radiation). The results were compared with those obta ined for pure potato starch. Effects of grinding and heating at 100° Con SAXS results were also examined.
Different scattering curves were obtained for various unirradiated products. Refl ect ions derived from starch were de tected for some uni rradiated :ls well as irradiated products. A reflection connected with long-range ordering in sta rch (co rresponding to the distance d =: 10 nm)was observed for potato, wheat, rye flour and potato powde r. A reflection corresponding to the distanced = 1.6 nm (due to short-range ordering) was observed in the cases of potato flour and potato powder. Comparison of diffractograms of gamma- irradiated and unirradiated products, have revea led changes of the reflection corresponding to d = 10 nm intensity and elevation of scattering curves, connected with changes of long-range ordering in starch gra nules. The effect of gamma-irradiation on long-range ordering in starch was also observed aft er heating of starch at 100°C. Heating at 100°C as well as grinding, cause diminution of long-range ordering m starch granules.
Ciesla, K.; Zoltowski, T.; and Diduszko, R.
"Physico-Chemical Changes Occurring in Gamma Irradiated Flours Studied by Small-Angle X-ray Scattering,"
2, Article 5.
Available at: http://digitalcommons.usu.edu/foodmicrostructure/vol12/iss2/5