All Physics Faculty Presentations
Measurement of Angle-resolved Secondary Electron Spectra
Document Type
Conference Paper
Journal/Book Title/Conference
Bulletin of the American Physical Society
Volume
44
Publication Date
1999
Abstract
Secondary electron emission (SEE) refers to the ejection of low-energy (< \sim 50 eV) electrons from solid surfaces as a result of energetic electron or ion bombardment. Empirical descriptions of SEE generally regard the process as a single phenomenon; fundamentally, however, SEE is the result of multiple underlying mechanisms involving a variety of electron-electron and electron-lattice momentum exchange processes. Details of these processes are as yet poorly understood. Though fundamental theoretical formulations have been offered, their level of detail has thus far exceeded the confirming ability of available data. AR SE spectra measurements may aid in assessing the role of bulk and surface plasmon decay into single-electron excitations, and provide a unique means for investigation of the angular distribution of various subgroups of the SE energy population. A full set of AR spectra for 1.5 keV electrons normally incident on polycrystalline gold has been obtained at USU. Preliminary results are discussed. Funding provided by NASAÕs Graduate Student Researchers Program.
Recommended Citation
R.E. Davies and JR Dennison, “Measurement of Angle-resolved Secondary Electron Spectra,” Bull. Am. Phys. Soc. 44(1) Part I, 212 (1999). American Physical Society Four Centennial Meeting, Atlanta , GA, March 22, 1999.
Comments
Bull. Am. Phys. Soc. 44(1) Part I, 212 (1999). American Physical Society Four Centennial Meeting, Atlanta , GA