X-Ray Diffraction and Scanning Electron Microscopy Analyses of a Gallium-Based Dental Restorative Alloy

Authors

Randa E. Shaker, The Ohio State University
William A. Brantley, The Ohio State University
Qiang Wu, The Ohio State University
John C. Mitchell, The Ohio State University

Abstract

Specimens of a gallium-based dental alloy were prepared with different condensation techniques, with and without the removal of a surface layer, and after aging for 2 hours at 50°, 100° and 150°C. X-ray diffraction at times ranging from 10 minutes to 1 day showed the development of the four matrix phases (ß-Sn, CuGa₂, Ga₂₈Ag₇₂, and In₄Ag₉) during the setting reaction. Scanning electron microscope (SEM) examination of specimens loaded to failure revealed brittle fracture, with greater porosity for hand-condensed specimens, and provided insight into crack propagation processes. Aging increased the amount of ß-Sn in freshly prepared specimens, and removal of the Ga-rich surface layer after condensation decreased the amount of this phase. For specimens stored for 5 weeks at room temperature, aging substantially increased the amount of the CuGa₂ phase but caused only moderate increases in the amount of ß-Sn.

Recommended Citation

Shaker, Randa E.; Brantley, William A.; Wu, Qiang; and Mitchell, John C. (1999) "X-Ray Diffraction and Scanning Electron Microscopy Analyses of a Gallium-Based Dental Restorative Alloy," Cells and Materials: Vol. 9: No. 1, Article 5.
Available at: https://digitalcommons.usu.edu/cellsandmaterials/vol9/iss1/5