About the README File Template

Data deposited into DigitalCommons are required to have a README file that provides enough information about your research to enable users to use the data in their own research.

The more information you provide, the easier it will be for you or someone else to reuse your data in the future.  

Complete all fields that pertain to your data, format so it is easy to read, and save in a plain text format.

1. Dataset Title: Aluminum Secondary Electron Yield data used in Lundgreen, 2019 "Strategies for Determining Electron Yield Material Parameters for Spacecraft Charge Modeling" 

2. Name and contact information of PI:
a. Name: JR Dennison 
b. Institution: Utah State Univeristy 
c. Address: 4415 Old Main Hill, Logan, UT 84322
d. Email: JR.Dennison@usu.edu 
e. ORCiD ID: 0000-0002-5504-3353 

3. Name and contact information of Co-PI:
a. Name: Phil Lundgreen 
b. Institution: Utah State University 
c. Address: 4415 Old Main Hill, Logan, UT 84322
d. Email: philliplundgreen@gmail.com e. ORCiD: 0000-0002-3589-1224 ID

4. 

6. Funding source (Agency, Grant Number) Ð if applicable

7. Project summary, abstract: Accurate modeling of spacecraft charging is essential to mitigate well-known and all-too-common deleterious and costly effects on spacecraft resulting from charging induced by interactions with the space plasma environment. This paper addresses how limited availability of electron emission and transport properties of spacecraft materials—in particular secondary electron yields—and the wide range measured for such properties pose a critical issue for modeling spacecraft charging.  It describes a materials charging database being developed, which when used in concert with the strategies outlined herein for best practices for establishing optimized materials properties for spacecraft charging models and specific mission requirements and how these properties may change with prolonged exposure to the space environment, should provide tools for more accurate material selection, increased confidence in charge models, and a concomitant decrease in mission risk. 

8. Brief description of collection and processing of data:  This data was acquired from a number of different sourced either by direct data copy, or by use of the java applet Datathief. The only dat manipulation came in the duplication and division of datasets by their maximum value(Reduced form). 9. Description of files (names, or if too numerous, number of files, file type(s): Included are two identical data files one is a .csv and one is an excel file. 

10. Definition of acronyms, codes, and abbreviations: SEY = Secondary Electron Yield(d), keV = kilo-electron-volt, E_red= reduced energy, SEY_red= reduced SEY, SEYmax (dmax)= the maximum yield achieved by a dataset, Emax= the energy associated with the dmax value 

11.  Description or definition any other unique information that would help others use your data:

12. Descriptions of parameters/variables
a. Temporal (beginning and end dates of data collection)
b. Instruments used and units of measurements:
c. Column headings of data files (for tabular data):E(keV), SEY, E_red, SEY_red 
d. Location/GIS Coverage (if applicable to data):
e. Symbol used for missing data:

13. Special software required to use data:

14. Publications that cite or use this data:"Strategies for Determining Electron Yield Material Parameters for Spacecraft Charge Modeling"

15. Was data derived from another data source?  Yes.  If so, what source? See listed papers 
Baglin, V., J. Bojko, C. Scheuerlein, O. Gröbner, M. Taborelli, B. Henrist and N. Hilleret (2000). “The secondary electron yield of technical materials and its variation with surface treatments,” Proc. EPAC 2000, Vienna, Austria.
Bronshtein, I. M. and B. S. Fraiman (1969). Vtorichnaya Elektronnaya Emissiya (Secondary Electron Emission), (Nauka-Moskva (Science-Moscow), Moscow, Russia).
Bruining, H., and J. H. De Boer. (1938), "Secondary electron emission: Part I. Secondary electron emission of metals." Physica 5, 17-30.
Copeland, P. L. (1935). "Secondary emission of electrons from complex targets." Phys. Rev. 48(1): 96.
Christensen, J., (2017) “Electron Yield Measurements of High-Yield Low Conductivity Dielectric Materials,” MS Thesis, Utah State Univ. Logan, UT.  
Czaja, W. (1966). "Response of Si and GaP p-n Junctions to a 5-to 40-keV Electron Beam." J. Appl. Phys. 37(11): 4236-4248.
Dennison, J. R., A.R. Frederickson, N. Green, Nelson, C.E. Benson, J. Brunson, and P. Swaminanthan, (2005) “Materials Database of Resistivities of Spacecraft Materials.,” Charge Collector Database [online database], NASA Space Environ. and Effects Prog., NASA Marshal Space Flight Center, URL: http://see.msfc.nasa.gov/ ee/db_chargecollector.htm . [cited January 10, 2019].
Farnsworth, H. E., “Electron bombardment of Metal Surfaces,” Phys. Rev. 25, 41, 1925.
Gibbons, D. J., (1964), “Secondary Electron Emission,” in Handbook of Vacuum Physics, A. H. W. Beck ed., (Mcmillan, New York), p. 318.
Kanter, H. (1961). "Contribution of backscattered electrons to secondary electron formation." Phys. Rev. 121(3): 681.
Moncrieff, D. A., and P. R. Barker. (1978), "Secondary electron emission in the scanning electron microscope." Scanning 1, 3 195-197.
Prokopenko, S. M. L., and J. G. Laframboise. (1980), "High voltage differential charging of geostationary spacecraft," J. Geophysical Res.: Space Phys. 85.A8 4125-4131. 
Reimer, L. and C. Tollkamp (1980). "Measuring the backscattering coefficient and secondary electron yield inside a scanning electron microscope." Scanning 3(1): 35-39.  
Shimizu, Ryuichi. "Secondary electron yield with primary electron beam of kiloelectron volts." J. Appl. Phys. 45.5 (1974): 2107-2111.  
Walker, C., M. El-Gomati, A. Assa'd and M. Zadražil (2008). "The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250–5000 eV: a theory/experiment comparison." Scanning 30(5): 365-380.
Warnecke, R. (1936). "Émission secondaire de métaux purs." J. Phys. Radium 7(6): 270-280. 

OPTIONAL Fields

If these pertain to your data, consider including them to facilitate use your data in the future:

1. Uncertainty, precision, and accuracy of measurements, if known:
2. Quality assurance and quality control that have been applied:
3. Known problems that limit dataÕs use (quality control, sampling issues, etc.):
4. Related datasets outside of this dataset:
5. Example records for each data file or file type:
6. Description of relationship between files and/or any file dependencies:
7. Information about other files (names, locations) and documents (such as field notes, publications, etc.) that would be helpful to a person using your data.