X-Ray microprobe (XMA) and electron energy-loss (EELS) spectrometers have been installed on the high-voltage electron microscope (HVEM). The probe size has been measured and background reduction is in progress for XMA and EELS as are improvements in electron optics for EELS and sensitivity measurements.
XMA is currently useful for qualitative analysis and has been used by several investigators from our laboratory and outside laboratories. However, EELS background levels are still too high for meaningful results to be obtained. Standards suitable for biological specimens are being measured, and a library for quantitative analysis is being compiled.
Tivol, W. F.; Barnard, D.; and Guha, T.
"Progress in Element Analysis on a High-Voltage Electron Microscope,"
Scanning Electron Microscopy: Vol. 1985
, Article 41.
Available at: https://digitalcommons.usu.edu/electron/vol1985/iss1/41