A review of ion-induced electron emission is presented which concentrates on the mechanisms relevant to imaging, analysis, and processing of surfaces by ion beams. In this field of applications, the main interest in electron emission lies in kinetic emission by heavy, i.e. multi-electron (Z > 2) ions of energy ≤ 100 keV.
Hofer, Wolfgang O.
"Ion-Induced Electron Emission from Solids,"
Scanning Microscopy: Vol. 1990
, Article 19.
Available at: https://digitalcommons.usu.edu/microscopy/vol1990/iss4/19