Scanning Microscopy


A general self-energy formulation of the interaction between an electron in a scanning transmission electron microscope (STEM) and a localized target is given. We prove a theorem relating the probability of energy transfer to that calculated classically. Local dielectric theory of target excitation for various geometries is discussed. The problem of localization of initially unlocalized excitations in the valence band of solids is treated by transforming cross sections differential in momentum transfer into dependence on an impact parameter variable. We are thereby able to account for experimental data in scanning electron microscopy (SEM) that show high spatial resolution.

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