New approaches are proposed to retrieve the wavefunction at the object and from this, to retrieve the projected structure of the object. The wavefunction is retrieved by capturing images at a series of closely spaced focus values and to process the whole 3D data. The structure of the object is retrieved using a formalism based on electron channelling.
Van Dyck, D. and Op de Beeck, M.
"Direct Methods in High Resolution Electron Microscopy,"
Scanning Microscopy: Vol. 1992
, Article 10.
Available at: https://digitalcommons.usu.edu/microscopy/vol1992/iss6/10