Simulations of images of surface steps obtained by high energy reflection electron microscopy are presented. It is shown that double images of simple steps, with no associated strain field, may occur when surface resonance conditions are established. Accurate calculation of image intensity requires large calculations and care is needed in relating the computed wave functions to those occurring for a semi-infinite incident wave. Estimates of the time to compute accurate wavefunctions are given and it is shown that they are reasonable for modem fast computers.
Anstis, G. R. and Gan, X. S.
"Simulation for Scanning Electron Microscopy,"
Scanning Microscopy: Vol. 1992
, Article 18.
Available at: https://digitalcommons.usu.edu/microscopy/vol1992/iss6/18