For many applications, scanning electron microscopy (SEM) images reflect the granular texture of analysed objects. So it is important to characterise the morphology of this texture and also to filter these images. Because the size of the texture is the main criterion to be studied, we have focused our paper on granulometric analysis.
We present basic parameters, morphological filtering and granulometry for Rn•R functions and their properties with local knowledge and anamorphosis.
Some applications in the domain of materials science illustrate these methods and present their suitable possibilities.
Prod'homme, Murielle; Coster, Michel; Chermant, Liliane; and Chermant, Jean-Louis
"Morphological Filtering and Granulometric Analysis on Scanning Electron Micrographs: Applications in Materials Science,"
Scanning Microscopy: Vol. 1992
, Article 24.
Available at: https://digitalcommons.usu.edu/microscopy/vol1992/iss6/24