Scanning Microscopy


In electron microscopy images can either be recorded in parallel (Transmission Electron Microscopy) or acquired as the variation in a signal as a probe is scanned over the specimen (Scanning Electron Microscopy). To extract the most information from an image requires that the best possible systems are used for acquiring image data. Ultimately, the limit to information capture is achieved when every electron from the scattering event of interest is recorded. The ideal system can be realised both for parallel recording with scientific grade CCD cameras, and for scanning microscopy with single electron counting electronics. The data rates from these different systems impose different constraints on the computer systems needed to acquire and display the incoming images.

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