This paper describes a multiple detector system based on a high-dispersion highly-corrected spectrometer close-coupled to a high-excitation objective lens. The design enables all post-specimen detectors (including the elastic dark-field detector) to be transferred to the post-spectrometer region.
This in turn makes possible the simultaneous acquisition of filtered bright-field, elastic dark-field and inelastic images.
The associated data acquisition system has provision for up to four simultaneous inputs and is based on a 32-bit microprocessor with 2 Mbytes of memory and 85 Mbytes of local disk storage. Images can be archived locally (cassette tape) or transferred via Ethernet to the laboratory central computer facility for off-line processing.
Jones, A. V. and Haider, M.
"Modular Detector System for Scanning Transmission Electron Microscope,"
Scanning Microscopy: Vol. 3
, Article 5.
Available at: https://digitalcommons.usu.edu/microscopy/vol3/iss1/5