Scanning Microscopy


Secondary Neutral Mass Spectrometry (SNMS) offers new possibilities for the analysis of insulators when the electron component of the postionizing SNMS plasma is employed for a precise compensation of sample charging. The compensation techniques for the three operation modes of SNMS, namely the direct, the separate and the external bombardment mode are described. Corresponding examples for bulk and depth profile analysis of insulating samples and dielectric thin film systems will be reported and discussed.

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