Scanning Microscopy


A Monte Carlo simulation model of particle-induced electron emission from beryllium, a candidate material for use on the wall in thermonuclear fusion devices, is developed. Comparative studies between secondary electron emission by electron bombardment and kinetic electron emission by proton bombardment reveal some interesting similarities and differences. The kinetic emission of electrons under heavy-ion bombardment is simulated as well for analyzing the effect of the initial charge state and mass of projectile ions on the kinetic emission. Furthermore, the model is applied to bowl-and-ripple structures for the study of surface roughness effects on the energy and angular distributions of secondary electrons, as well as of the secondary electron yield of beryllium under electron bombardment.

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