Secondary Electron Yield Measurements of Carbon Nanotube Forests: Dependence on Morphology and Substrate

Authors

Brian Wood, Utah State UniversityFollow
Justin Christensen, Utah State University
Gregory Wilson, Utah State UniversityFollow
T. -C. Shen, Utah State UniversityFollow
JR Dennison, Utah State UnivesityFollow

Document Type

Conference Paper

Journal/Book Title/Conference

SCTC

Publication Date

2018

Recommended Citation

Wood, Brian; Christensen, Justin; Wilson, Gregory; Shen, T. -C.; and Dennison, JR, "Secondary Electron Yield Measurements of Carbon Nanotube Forests: Dependence on Morphology and Substrate" (2018). SCTC. Conference Proceedings. Paper 45.
https://digitalcommons.usu.edu/mp_conf/45