PEA System Modeling and Signal Processing for Measurement of Volume Charge Distributions in Thin Dielectric Films
This paper discusses our effort to develop advanced pulsed electroacoustic (PEA) measurement system capabilities that incorporate (1) improved signal processing tools for increased signal/noise ratios; and (2) integrated PEA modeling tools. In addition, we emphasize state-of-the-art system electronic components, integrated environmental controls, and sensor improvements required to achieve high spatial resolution while maintaining reasonable temporal resolution for both ambient and in vacuo measurements of thin dielectrics charged using electron beam injection, which is most applicable for spacecraft charging tests. PEA measurement systems provide an important tool to investigate the spatial extent and dynamic evolution of embedded charge distributions in thin dielectric materials. This knowledge has important applications in spacecraft industries, as well as for semiconductors, high-power electronic devices, high-voltage DC power cable insulation, and high-energy and plasma physics apparatus. The emphasis of this paper is on improved signal processing methods and integrated PEA modeling tools.