Critical Electron Dose Threshold for Measuring the Electron Yield of Unbiased Highly Insulating Materials

Authors

Ryan Hoffmann
Jonathon Abbott
John R. Dennison, Utah State UniversityFollow

Document Type

Conference Paper

Journal/Book Title/Conference

Bulletin of the American Physical Society

Volume

51

Publication Date

2008

Comments

Bull. Am. Phys. Soc. 51(1) Part II, (2006). American Physical Society March Meeting 2006, March 13-17, 2006, Baltimore, MD

Recommended Citation

Ryan Hoffmann, Jonathon Abbot, and JR Dennison, “Critical Electron Dose Threshold for Measuring the Electron Yield of Unbiased Highly Insulating Materials,” Bull. Am. Phys. Soc. 51(1) Part II, (2006). American Physical Society March Meeting 2006, March 13-17, 2006, Baltimore, MD.