Total Ionizing Dose (TID) and Single Event Effects (SEE) Tolerances of Various COTS Micro-Computers for a Nano-Satellite Mission

Rafael Leon, Kyushu Institute of Technology
Kenichi Asami, Kyushu Institute of Technology
Kei-ichi Okuyama, Kyushu Institute of Technology

This paper has been withdrawn.
 
Aug 1st, 12:00 AM

Total Ionizing Dose (TID) and Single Event Effects (SEE) Tolerances of Various COTS Micro-Computers for a Nano-Satellite Mission