Scanning Electron Microscopy
Abstract
An analysis of all the factors which contribute to the electron probe size in a scanning electron microscope and of the correct method of combining those effects to give optimum performance. Assuming perfect specimen preparation the only other factors are the non-local nature of the basic electron interactions and the nature of the display system.
Recommended Citation
Crewe, Albert V.
(1985)
"Towards the Ultimate Scanning Electron Microscope,"
Scanning Electron Microscopy: Vol. 1985:
No.
2, Article 1.
Available at:
https://digitalcommons.usu.edu/electron/vol1985/iss2/1