Scanning Electron Microscopy
Abstract
We are making further advances in non-destructive and non-contact thermal imaging with infrared detection. We employ a chopped and scanned electron beam as heat source, a cooled HgCdTe infrared detector as temperature sensor, and digital processing of the measured temperature pattern for display and storage. The results give a convincing, high contrast image of subsurface structures.
Recommended Citation
Dacol, F. H.; Ermert, H.; and Melcher, R. L.
(1984)
"Advances in Non-Contact Thermal-Wave Imaging with Infrared Detection,"
Scanning Electron Microscopy: Vol. 1985:
No.
2, Article 14.
Available at:
https://digitalcommons.usu.edu/electron/vol1985/iss2/14