The analytical method of X-ray fluorescence spectrometry has been used to analyze obsidian artifacts from Cerros, Belize and from Yaxchilan, Chiapas, Mexico. The results of these analyses are compared to the results of analysis of obsidian geologic sources using graphical and statistical methods in order to identify the probable source from which the obsidian for the artifacts came. These results are then summarized along with results of analysis by others of obsidian artifacts from several archaeological sites in the Lowland Maya area. Using these data, possible trade routes and how they may have changed through time have been postulated.
Nelson, F. W.
"Summary of the Results of Analysis of Obsidian Artifacts from the Maya Lowlands,"
Scanning Electron Microscopy: Vol. 1985
, Article 15.
Available at: https://digitalcommons.usu.edu/electron/vol1985/iss2/15