Quantitative Microanalysis by Time-of-Flight Laser Probe Mass Spectrometry

Authors

J. F. Eloy, Centre d'Etudes Nucléaires de Grenoble Institut de Recherche et de Développement Industriel

Abstract

Quantitative multielement microanalyses of insulators and refractory materials are made with an advanced laser microprobe mass spectrometer (LPMS-2S). A plasma in local thermal equilibrium (LTE) is generated in a field-free region in the ion source by a short laser pulse. A magnetic time-of-flight (TOF) mass analyzer is used to optimize ion transmission and mass separation. And, an Eloy-Unsold wide aperture ion detector provides the low noise and wide dynamic range required for accurate analyses. The characteristics of the LPMS-2S are demonstrated with NBS standard reference glasses and are compared with the characteristics of the commercially available LAMMA and LIMA microprobe mass spectrometers.

Recommended Citation

Eloy, J. F. (1986) "Quantitative Microanalysis by Time-of-Flight Laser Probe Mass Spectrometry," Scanning Electron Microscopy: Vol. 1986: No. 4, Article 1.
Available at: https://digitalcommons.usu.edu/electron/vol1986/iss4/1