Ninety Degree Tilt Module and Double-Sided Stub for Scanning Electron Microscopy

Authors

G. L. C. McTurk, Leicester University Scanning Electron Microscope Unit

Abstract

A simple inexpensive device to achieve ninety degree tilt in some scanning electron microscopes (SEM) not equipped with this facility. A new method of safely mounting and studying both sides of the same fragile flat specimen, without the hazards of remounting; used in conjunction with this device.

Recommended Citation

McTurk, G. L. C. (1986) "Ninety Degree Tilt Module and Double-Sided Stub for Scanning Electron Microscopy," Scanning Electron Microscopy: Vol. 1986: No. 4, Article 46.
Available at: https://digitalcommons.usu.edu/electron/vol1986/iss4/46