The image processing techniques used 'a posteriori' to extract information from electron micrographs are surveyed, including particularly image averaging, selective averaging, 3-D reconstruction, and high resolution focal series restoration; recent developments in online image pick up and control have led to fully automatic focussing, stigmating and alignment by a frame store system equipped with a real time correlator board. The diversity of the techniques encountered calls for large integrated program systems with flexible command languages; however, a dilemma exists between providing the user with convenient control of special hardware facilities such as frame stores and array processors, and preventing the programs from becoming so specific that they are extremely short lived. Some of the compromises made in the Semper system are noted.
Saxton, W. O.
"Interactive Image Processing for Electron Microscopy: Matching Hardware with Software,"
Scanning Electron Microscopy: Vol. 3
, Article 23.
Available at: https://digitalcommons.usu.edu/electron/vol3/iss1/23