Scanning Electron Microscopy


A method is discussed for designing electrostatic and magnetic imaging systems without image rotation. Tsukkerman's condition for an imaging system free of rotation does not appear to be applicable to practical designs. We have modified his theory to obtain two other conditions for the normalized axial electric potential V(z), the normalized axial magnetic induction G(z), and a lens strength parameter 𝞴 which can be interpreted as an eigen-value. Some analytical examples and numerical results are given.

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