Magnetic Domain Observation using Spin-Polarized Scanning Electron Microscopy

Authors

K. Koike, Hitachi, Ltd.
H. Matsuyama, Hitachi, Ltd.
H. Todokoro, Hitachi, Ltd.
K. Hayakawa, Hitachi, Ltd.

Abstract

A new apparatus, spin-polarized scanning electron microscope (SEM), has been developed. This is a unique apparatus, which forms images by electron spin polarization. By using this device, magnetic domain images can be obtained because secondary electrons from ferromagnetic samples are polarized representing the magnetization of the sample originating point. This method provides new capabilities, such as magnetic contrast independent of surface morphology, detection of magnetization direction, and high spatial resolution.

Recommended Citation

Koike, K.; Matsuyama, H.; Todokoro, H.; and Hayakawa, K. (1986) "Magnetic Domain Observation using Spin-Polarized Scanning Electron Microscopy," Scanning Microscopy: Vol. 1: No. 1, Article 4.
Available at: https://digitalcommons.usu.edu/microscopy/vol1/iss1/4