Analysis of Thick Targets by Proton-Induced X-Ray Emission

Authors

J. L. Campbell, University of Guelph
A. Perujo, University of Guelph
W. J. Teesdale, University of Guelph
J. A. Maxwell, University of Guelph

Abstract

Most published PIXE (proton-induced X-ray emission) work concerns thin targets. Recently progress in improving both the fundamental data base and in developing a range of standardization techniques has propelled thick target analysis to the forefront of activity in the PIXE field. Limits of detection are a complex issue depending not only on the continuous background but also on the characteristic X-rays of the matrix; in favorable cases a few ppm may be reached in convenient analysis times. The unfolding of multi-element PIXE spectra is akin to the same problem in EPMA (electron probe microanalysis), and EPMA methodologies, especially as regards background removal, have a role to play: accurate analytic lineshapes for Si(Li) detectors are a crucial ingredient of accurate extraction of peak areas. Analyses of a binary compound and of the NBS aluminum alloy SRM 1258 illustrate the current capabilities of TTPIXE (thick-target PIXE). Recent computer simulation work extends TTPIXE's capability from the customary smooth specimens to targets with curved or randomly rough surfaces.

Recommended Citation

Campbell, J. L.; Perujo, A.; Teesdale, W. J.; and Maxwell, J. A. (1987) "Analysis of Thick Targets by Proton-Induced X-Ray Emission," Scanning Microscopy: Vol. 1: No. 4, Article 14.
Available at: https://digitalcommons.usu.edu/microscopy/vol1/iss4/14