Processing of Scanning Electron Microscope Images on Basis of Fast Fourier-Transformation

Authors

A. Yu. Sasov, Moscow State University
A. A. Shanyavsky, Moscow State University

Abstract

The solar cell as a combined substrate and detector was used for automated SEM-image analysis. It was noted that an image processing system was created and its operational features are shown in some typical applications. The step size of the fatigue striations was found. The obtained value of the step corresponds to the formula with an accuracy of about 1 per cent. Quantum-mechanical constant of material fracture for aluminum alloys was found to be 𝛥 = 0.22. Two-dimensional periodic analysis was applied to fracture surfaces and a microchannel plate. The integral characteristics of microstructure was determined quantitatively.

Recommended Citation

Sasov, A. Yu. and Shanyavsky, A. A. (1987) "Processing of Scanning Electron Microscope Images on Basis of Fast Fourier-Transformation," Scanning Microscopy: Vol. 2: No. 2, Article 18.
Available at: https://digitalcommons.usu.edu/microscopy/vol2/iss2/18