Scanning Microscopy
Abstract
Cryo-preparation of specimens for scanning electron microscopy can be completed within a few minutes. Chemical fixation and contact with solvents is avoided, levels of specimen hydration are maintained, low melting-point materials are stabilized, volume changes are minimized and internal structure can be revealed by freeze-fracture. Elements are not lost or substantially relocated prior to X-ray microanalysis and specimen luminescence is enhanced. The displacement of internal structure and material subject to X-ray microanalysis by the growth of ice crystals in hydrated samples can be minimized by adopting fast freezing methods designed to limit ice crystal growth. The technique enables a wide range of industrial and biological materials to be examined rapidly and free from artifacts commonly associated with more conventional preparation methods.
Recommended Citation
Sargent, J. A.
(1988)
"Low Temperature Scanning Electron Microscopy: Advantages and Applications,"
Scanning Microscopy: Vol. 2:
No.
2, Article 19.
Available at:
https://digitalcommons.usu.edu/microscopy/vol2/iss2/19