Field Ion Microscopy and Atom-Probe Mass Spectroscopy: Techniques and Selected Applications

Authors

G. L. Kellogg, Sandia National Laboratories

Abstract

The techniques of field ion microscopy and atom-probe mass spectroscopy are reviewed with emphasis on the general operational principles of the instruments and selected applications in the area of surface science. The single atom imaging capability of the field ion microscope is shown to make it uniquely suited to the study of detailed, atomic processes on clean metal surfaces. As examples, investigations of single-atom surface diffusion, cluster nucleation, and surface reconstructions are discussed. The ability of the atom-probe mass spectrometer to determine the chemical identity of selected atoms observed in the field ion microscope image is shown to be useful for the microanalysis of various materials. The different types of atom-probes currently in use and their application in the areas of surface catalyzed reactions and high-temperature ceramic superconductors are described.

Recommended Citation

Kellogg, G. L. (1988) "Field Ion Microscopy and Atom-Probe Mass Spectroscopy: Techniques and Selected Applications," Scanning Microscopy: Vol. 2: No. 4, Article 4.
Available at: https://digitalcommons.usu.edu/microscopy/vol2/iss4/4