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Scanning Microscopy

Abstract

An improved holder has been designed for a cobalt calibrating standard used in an EDS Link 10,000 system attached to a JEOL 840 SEM. This holder allows the calibration of the EDS software for a wide range of samples differing in size, surface and height. These differences usually cause difficulties during quantitative analyses. The new holder allows the position of the cobalt to be adjusted according to the size and height of the sample.

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