Scanning Microscopy
Abstract
This article updates the paper "Secondary Electron Emission from Solids by Electron and Proton Bombardment" published in Scanning Microscopy Vol. 2, pages 607-632 (1988). The recent development in secondary electron emission from solids by electron or proton bombardment is reviewed. The similarities between electron- and ion-induced emission are emphasized. Recent theoretical results for the emission from beryllium agree well with existing experimental results. Results from new directions are included in the discussion.
Recommended Citation
Schou, Jørgen
(1989)
"Secondary Electron Emission: Progress and Prospects,"
Scanning Microscopy: Vol. 3:
No.
2, Article 4.
Available at:
https://digitalcommons.usu.edu/microscopy/vol3/iss2/4