A Simulation of Secondary Electron Trajectories in Solids

Authors

M. Kotera, Osaka Institute of Technology
T. Kishida, Osaka Institute of Technology
H. Suga, Osaka Institute of Technology

Abstract

A Monte Carlo calculation model is introduced to simulate not only the primary electron behavior but also the secondary electron cascade in a specimen bombarded with an electron beam. Electrons having energy greater than 0.1keV are treated as "fast electrons" and the single scattering Monte Carlo model is adopted. Electrons having energy smaller than 0.1keV are treated as "slow electrons" and the electron cascade Monte Carlo model is used. The calculated results for the energy distribution of secondary electrons, and primary electron energy dependence of the total secondary yield and the backscattering yield are in good agreement with experimental results.

Recommended Citation

Kotera, M.; Kishida, T.; and Suga, H. (1989) "A Simulation of Secondary Electron Trajectories in Solids," Scanning Microscopy: Vol. 3: No. 4, Article 1.
Available at: https://digitalcommons.usu.edu/microscopy/vol3/iss4/1