Particle Induced X-Ray Emission Elemental Analysis: Sample Preparation for a Versatile Instrumental Method

Authors

N. F. Mangelson, Brigham Young University
M. W. Hill, Brigham Young University

Abstract

Particle induced X-ray emission (PIXE) has found extensive application as a multi-element analysis tool. The energetic nature of both the incident particle beam and the emitted characteristic X-rays has lead to considerable versatility in regard to samples which may be analyzed by the PIXE technique. This paper does not deal with the theory, equipment, or data analysis for PIXE, but it should bring to the reader a broad perspective of methods for sample preparation and should point the way into the literature where more complete details are given. Both physical and chemical processes for sample preparation are outlined. Preparation often requires a combination of methods. Characteristics of the PIXE method should be given careful consideration when preparing samples for analysis and these are briefly noted.

Recommended Citation

Mangelson, N. F. and Hill, M. W. (1990) "Particle Induced X-Ray Emission Elemental Analysis: Sample Preparation for a Versatile Instrumental Method," Scanning Microscopy: Vol. 4: No. 1, Article 6.
Available at: https://digitalcommons.usu.edu/microscopy/vol4/iss1/6