Scanning Microscopy


A measuring procedure and a computer program have been developed for energy dispersive microanalysis to study segregation properties of various bulk, polished samples (alloys and ceramics). A few hundred sampling points were selected at random or regularly forming a grid pattern on the surface of the sample. Energy dispersive spectra were stored and ZAF corrected, and the obtained concentrations were evaluated statistically. An IBM AT compatible computer was used to calculate concentration distribution functions of the elements present in the sample. In addition to the usual statistical values, several types of concentration distribution functions were calculated. The method was tested on an Al-Mn standard sample used for spark excited optical spectroscopy and on refractory bricks. The advantages of this method as compared to concentration mapping are discussed.

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