Scanning Microscopy
Abstract
Scanning near field optical microscopy (SNOM) is the optical alternative of the scanning probe microscopical techniques which enables a lateral resolution down to about 10 nm, unlimited by diffraction. Moreover, the potential of non-destructive imaging of chemical and biological samples with nanometer resolution in ambient conditions is a crucial advantage over electron microscopy.
An integrated microscope has been constructed which allows simultaneous detection of optical and force interaction between a microfabricated SiN probe and a sample surface. Images are obtained in a transmission mode by detection of the light emanating from a "supertip" in contact with the sample surface and illuminated by total internal reflection. Physical and technical aspects of the instrument are discussed and illustrated with typical images.
Recommended Citation
Moers, M. H. P.; Tack, R. G.; van Hulst, N. F.; and Bölger, B.
(1993)
"A Combined Near Field Optical and Force Microscope,"
Scanning Microscopy: Vol. 7:
No.
3, Article 3.
Available at:
https://digitalcommons.usu.edu/microscopy/vol7/iss3/3