Imaging of Local Thermal and Electrical Conductivity with Scanning Force Microscopy

Authors

M. Maywald, Bergische Universität Wuppertal
R. J. Pylkki, TopoMetrix, Santa Clara
L. J. Balk, Bergische Universität Wuppertal

Abstract

The evaluation of thermal and electrical properties has been demonstrated using a scanning force microscope under ambient air condition. For the first time, the investigation of thermal conductivity on a chemical vapor deposited (CVD) grown diamond surface has been performed with a lateral resolution below 200 nm. Depending on the growing parameters, structures consisting of lines of different thicknesses and spacings are visible. The determination of the electrical structure has been carried out with a resolution of 2 nm using the contact current mode (CCM) showing similar structures. The thermal images exhibit a high thermal conductivity mostly on the diamond crystals whereas the electrical conductivity reached its highest values between them.

Recommended Citation

Maywald, M.; Pylkki, R. J.; and Balk, L. J. (1994) "Imaging of Local Thermal and Electrical Conductivity with Scanning Force Microscopy," Scanning Microscopy: Vol. 8: No. 2, Article 4.
Available at: https://digitalcommons.usu.edu/microscopy/vol8/iss2/4