Scanning Microscopy


Cherenkov radiation and transition radiation, which are generated by high energy electrons with constant velocity, can be detected in a transmission electron microscope using a cathodoluminescence (CL) detection system. The characteristic peaks due to interference were observed in the emission spectra from thin films of mica, silicon and silver, and their dependence on sample thickness and accelerating voltage was studied. Particles of BaTiO3 and MgO also showed characteristic feature in the spectra which changed with their size. A recently developed imaging system revealed the two-dimensional intensity distribution of these radiations; for example, oscillating contrast, such as equal thickness contour appears in silicon, and hole edges in a silver thin film show bright fringe contrast due to radiative surface plasmon.

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