Date of Award:

5-2015

Document Type:

Dissertation

Degree Name:

Doctor of Philosophy (PhD)

Department:

Electrical and Computer Engineering

Committee Chair(s)

Koushik Chakraborty

Committee

Koushik Chakraborty

Committee

Sanghamitra Roy

Committee

Todd Moon

Committee

Chris Winstead

Committee

Dan Watson

Abstract

The trend towards massive parallel computing has necessitated the need for an On-Chip communication framework that can scale well with the increasing number of cores. At the same time, technology scaling has made transistors susceptible to a multitude of reliability issues. This dissertation demonstrates design techniques that address both reliability and security issues facing modern NoC architectures. The reliability and security problem is tackled at different abstraction levels using a series of schemes that combine information from the architecture-level as well as hardware-level in order to combat aging effects and meet secure design stipulations while maintaining modest power-performance overheads.

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