Direct Methods in High Resolution Electron Microscopy

Authors

D. Van Dyck, University of Antwerp, Belgium
M. Op de Beeck, University of Antwerp, Belgium

Abstract

New approaches are proposed to retrieve the wavefunction at the object and from this, to retrieve the projected structure of the object. The wavefunction is retrieved by capturing images at a series of closely spaced focus values and to process the whole 3D data. The structure of the object is retrieved using a formalism based on electron channelling.

Recommended Citation

Van Dyck, D. and Op de Beeck, M. (1992) "Direct Methods in High Resolution Electron Microscopy," Scanning Microscopy: Vol. 1992: No. 6, Article 10.
Available at: https://digitalcommons.usu.edu/microscopy/vol1992/iss6/10