Scanning Microscopy
Volume 1992, Number 6 (1992) Signal and Image Processing in Microscopy and Microanalysis
Articles
A Brief Introduction to Aims and Methods for Image Processing of Electron Micrographs of Biological Specimens
Murray Stewart
Alignment, Classification, and Three-Dimensional Reconstruction of Single Particles Embedded in Ice
Joachim Frank, Pawel Penczek, and Weiping Liu
Structure Analysis of Ice-Embedded Single Particles
M. van Heel, H. Winkler, E. Orlova, and M. Schatz
Three-Dimensional Crystallographic Reconstruction for Atomic Resolution
Kenneth H. Downing
Confocal Microscopy and Three-Dimensional Reconstruction of Thick, Transparent, Vital Tissue
Barry R. Masters
Acquisition Hardware for Imaging
Peter Rez, J. K. Weiss, and W. J. de Ruijter
Measurement of Electron-Optical Parameters for High-Resolution Electron Microscopy Image Interpretation
A. F. de Jong and A. J. Koster
Application of Slow-Scan Charge-Coupled Device (CCD) Cameras to On-Line Microscope Control
O. L. Krivanek and G. Y. Fan
Direct Methods in High Resolution Electron Microscopy
D. Van Dyck and M. Op de Beeck
Random Image Models for Microstructure Analysis and Simulation
Dominique Jeulin
Morphological Three-Dimensional Analysis
C. Gratin and F. Meyer
Nonlinear Statistical Filtering and Applications to Segregation in Steels from Microprobe Images
C. Daly, D. Jeulin, and D. Benoît
Some Applications of Image Analysis to Materials Science
François Grillon
Application of the Wavelet Transform to the Digital Image Processing of Electron Micrographs and of Backreflection Electron Diffraction Patterns
A. Gómez, L. Beltrán del Río, D. Romeu, and M. Jose Yacamán
Multi-Dimensional Data Analysis and Processing in Electron-Induced Microanalysis
N. Bonnet and P. Trebbia
Image Algebra and Restoration
P. W. Hawkes
Simulation for Scanning Electron Microscopy
G. R. Anstis and X. S. Gan
Diffraction and Imaging Theory of Inelastically Scattered Electrons - A New Approach
Z. L. Wang and J. Bentley
Image-Matching as a Means of Atomic Structure Evaluation in High Resolution Transmission Electron Microscopy
John C. Barry
A Robust Solution to the Super-Resolution Phase Problem in Scanning Transmission Electron Microscopy
J. M. Rodenburg and B. C. McCallum
Sub-Angstrom Microscopy Through Incoherent Imaging and Image Reconstruction
S. J. Pennycook, D. E. Jesson, M. F. Chisholm, A. G. Ferridge, and M. J. Seddon
Segmentation of Pores in Backscattered Images of Sediments and Soils and their Relationship to Domain Structure
M. W. Hounslow and N. K. Tovey
Morphological Filtering and Granulometric Analysis on Scanning Electron Micrographs: Applications in Materials Science
Murielle Prod'homme, Michel Coster, Liliane Chermant, and Jean-Louis Chermant
Processing Multi-Spectral Scanning Electron Microscopy Images for Quantitative Microfabric Analysis
N. K. Tovey, D. L. Dent, W. M. Corbett, and D. H. Krinsley
Image Segmentation Applied to Scanning Electron Microscopy Multi-Images of Weathered Stones of Monuments
M. Rautureau, R. Harba, and G. Jacquet
Automatic Orientation Analysis of Microfabric
N. K. Tovey, P. Smart, M. W. Hounslow, and J. P. Desty
Random Access Direct Parallel Detection of Electron Energy Loss Spectra with a New Photodiode Array
Stephan la Barré, Eckhard Quandt, and Heinz Niedrig
On-Line Processing and Computer Control in High Resolution Transmission Electron Microscopy
F. A. Ponce and H. Hikashi
Quantification of High-Resolution Lattice Images and Electron Holograms
W. J. de Ruijter, M. Gajdardziska-Josifovska, M. R. McCartney, R. Sharma, David J. Smith, and J. K. Weiss
The Application of Multispectral Techniques to Analytical Electron Microscopy
P. G. Kenny, M. Prutton, R. H. Roberts, I. R. Barkshire, J. C. Greenwood, M. J. Hadley, and S. P. Tear
Cathodoluminescence Image Processing of High TC Superconductors
Z. Barkay, G. Deutscher, and E. Grunbaum
Image Delocalisation and High Resolution Transmission Electron Microscopic Imaging with a Field Emission Gun
W. Coene and A. J. E. M. Jansen
An Optical Moiré Technique for the Analysis of Displacements in Lattice Images
C. J. D. Hetherington and U. Dahmen
Phase Space Methods in Image Formation Theory
Victor Castaño, Gustavo Vásquez-Polo, and Ramón Gutiérrez-Castrejón
Atomic Resolution Electron Holography
K. Ishizuka, T. Tanji, and A. Tonomura
Digital Image Processing of Electron Micrographs: The PIC System II
Benes L. Trus, Michael Unser, Thierry Pun, and Alasdair C. Steven
This is the proceedings of the 10th Pfefferkorn Conference. Held September 27-30, 1991 at University of Cambridge, U.K.