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Scanning Microscopy

Abstract

The advantage of all different kinds of electron holography lies in the fact that in addition to the image intensity they make use of the phase in real space and in Fourier space. Therefore, they are in principle superior to conventional imaging techniques, even if these are supported by highly sophisticated methods of image processing. The technique of electron off-axis holography, under development in Tübingen for more than 20 years, now enters atomic resolution domain. After correction of aberrations, amplitudes and phases can be determined quantitatively, both in real space and Fourier space, opening up novel facilities for the analysis of structures at atomic dimensions.

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