Sample Bias Influence on Angular-Resolved Secondary Electron Emission

Authors

Neal Nickles
R. E. Davies
John R. Dennison, Utah State UniversityFollow

Document Type

Presentation

Journal/Book Title/Conference

Sample Bias Influence on Angular-Resolved Secondary Electron Emission

Publication Date

1998

Comments

American Physical Society Four Corners Sectional Meeting, Provo, UT

Recommended Citation

Neal Nickles, R.E. Davies and JR Dennison, “Sample Bias Influence on Angular-Resolved Secondary Electron Emission,” American Physical Society Four Corners Sectional Meeting, Provo, UT, October 17, 1998.