Materials Characterization at Utah State University: Facilities and Knowledgebase of Electronic Properties of Materials Applicable to Spacecraft Charging

Authors

John R. Dennison, Utah State UniversityFollow
C. D. Thomson
J. T. Kite
V. V. Zavyalov
Jodie Corbridge, Utah State University

Document Type

Presentation

Journal/Book Title/Conference

8th Spacecraft Charging Technology Conference

Publisher

Spacecraft Charging Technology

Publication Date

10-2003

Abstract

In an effort to improve the reliability and versatility of spacecraft charging models designed to assist spacecraft designers in accommodating and mitigating the harmful effects of charging on spacecraft, the NASA Space Environments and Effects (SEE) Program has funded development of facilities at Utah State University for the measurement of the electronic properties of both conducting and insulating spacecraft materials. We present here an overview of our instrumentation and capabilities, which are particularly well suited to study electron emission as related to spacecraft charging. These measurements include electron-induced secondary and backscattered yields, spectra, and angular resolved measurements as a function of incident energy, species and angle, plus investigations of ion-induced electron yields, photoelectron yields, sample charging and dielectric breakdown. Extensive surface science characterization capabilities are also available to fully characterize the samples in situ. Our measurements for a wide array of conducting and insulating spacecraft materials have been incorporated into the SEE Charge Collector Knowledgebase as a Database of Electronic Properties of Materials Applicable to Spacecraft Charging. This Database provides an extensive compilation of electronic properties, together with parameterization of these properties in a format that can be easily used with existing spacecraft charging engineering tools and with next generation plasma, charging, and radiation models. Tabulated properties in the Database include: electron-induced secondary electron yield, backscattered yield and emitted electron spectra; He, Ar and Xe ion-induced electron yields and emitted electron spectra; photoyield and solar emittance spectra; and materials characterization including reflectivity, dielectric constant, resistivity, arcing, optical microscopy images, scanning electron micrographs, scanning tunneling microscopy images, and Auger electron spectra. Further details of the instrumentation used for insulator measurements and representative measurements of insulating spacecraft materials are provided in other Spacecraft Charging Conference presentations. The NASA Space Environments and Effects Program, the Air Force Office of Scientific Research, the Boeing Corporation, NASA Graduate Research Fellowships, and the NASA Rocky Mountain Space Grant Consortium have provided support.

Comments

Paper presented at the 8th Spacecraft Charging Technology Conference. PDF available for download through link above.

Recommended Citation

JR Dennison, C.D. Thomson, J. Kite, V. Zavyalov and, Jodie Corbridge, “Materials Characterization at Utah State University: Facilities and Knowledgebase of Electronic Properties of Materials Applicable to Spacecraft Charging,” 8th Spacecraft Charging Technology Conference, 20-24 October 2003, Marshall Space Flight Center, Huntsville, AL.