Effects Of Incident Electron Fluence And Energy On The Electron Yield Curves And Emission Spectra Of Dielectrics

Alec Sim,
JR Dennison, Utah State University
Clint Thomson,

Bull. Am. Phys. Soc. 50(1) Part II, (2005). American Physical Society March Meeting 2005, March 21-25, 2005, Los Angeles, CA.

Abstract