Secondary Electron Production and Transport Mechanisms by Measurement of Angle-EnergyResolved Cross Sections of Secondary and Backscattered Electrons

Authors

Jason Kite
John R. Dennison, Utah State UniversityFollow

Document Type

Presentation

Journal/Book Title/Conference

9th Rocky Mountain NASA Space Grant Consortium Symposium

Publisher

Rocky Mountain NASA Space Grant Consortium

Publication Date

2003

Abstract

The angle dependence of emitted electron spectra from a polycrystalline Au surface has been measured at several incident electron beam energies. The range of incident energies (~100 eV to 2500 eV) extends from below the first crossover energy, through Emax, to above the second crossover energy. The traditional distinction between secondary electrons (50 eV) is found to be inconsistent with our energy- and angle-resolved measurements. We suggest a more “natural” delineation occurs at the local minima of the emission spectra; this feature is studied as a function of incident energy and emission angle. This work is also supported by the NASA Space Environments and Effects Program.

Comments

9th Rocky Mountain NASA Space Grant Consortium Symposium, Salt Lake City, UT

Recommended Citation

Jason Kite with JRDennison, “Secondary Electron Production and Transport Mechanisms by Measurement of Angle-Energy Resolved Cross Sections of Secondary and Backscattered Electrons,” 9th Rocky Mountain NASA Space Grant Consortium Symposium, Salt Lake City, UT, May 2003.