Selective Modulation Interferometric Spectrometer (SIMS) Technique Applied to Background Suppression
Document Type
Article
Journal/Book Title/Conference
Optical Engineering
Issue
18
Publication Date
1-1-1979
First Page
403
Last Page
408
Abstract
A method of using the SIMS (the Selective Modulation Interferometric Spectrometer) to measure the difference between the spectral content of two optical beams is given. The differ - encing is done optically; that is, the modulated detector signal is directly proportional to the difference between the two spectra being compared. This optical differencing minimizes the dynamic -range requirements of the electronics and requires only a simple modification of the basic cyclic SIMS spectrometer. This technique can be used to suppress background radiation for the enhancement of target detection and tracking. Laboratory measurements demonstrating the application of this technique are reported.
Recommended Citation
Vanasse, George A.; Esplin, Roy W.; and Huppi, Ronald J., "Selective Modulation Interferometric Spectrometer (SIMS) Technique Applied to Background Suppression" (1979). Space Dynamics Laboratory Publications. Paper 136.
https://digitalcommons.usu.edu/sdl_pubs/136