Abstract

Carbon nanotube technology, in conjunction with silicon micro-fabrication techniques, has enabled us to develop planar radiometric detectors, which is leading to the establishment of a new generation of primary standards at NIST. We will discuss the application of this technology to the development of this new generation of chip detectors [1,2]. The goal is to develop compact, fast, and easy-to-use calibration systems, spanning the wavelength spectrum from the ultraviolet to the THz region [3,4] in a single detector, suitable for use with both coherent and incoherent sources, and encompassing open beam and fibre-coupled modes of operation, with utility beyond that of the laboratory environment.

Recent work to enhance the absorptivity of nanotube arrays, using post-growth treatments, and the characterization of noise in temperature sensing thermistors will be presented [5].

Finally, work comparing scales, derived from two new table-top systems, to existing radiant power and optical fibre power scales traceable to SI will be presented.

1. N. A. Tomlin, M. White, I. Vayshenker, S. I. Woods, J. H. Lehman, Planar electrical substitution carbon nanotube cryogenic radiometer, Metrologia 52, 2, 376-383, (2015)

2. N. Tomlin, A. Curtin, M. White, J. Lehman, Decrease in reflectance of vertically-aligned carbon nanotubes after oxygen plasma treatment, Carbon, 74, 329-332, (2014)

3. A. Steiger, R. Mueller, A. Remesal Oliva, Y. Deng, Q. Sun, M.G. White, J.H. Lehman, Terahertz laser power measurement comparison, IEEE Transactions on Terahertz Science and Technology, 6, 5, 664-669, (2016)

4. J. Lehman, A. Steiger, N. Tomlin, M. White, M. Kehrt, I. Ryger, M. Stephens, C. Monte, I. Mueller, J. Hollandt, M. Dowell, Planar hyper-black absolute radiometer, Optics Express, 24, 23, 25911-25921, (2016)

5. I. Ryger, D. Harber, M. Stephens, M. White, N. Tomlin, M. Spidell, J. Lehman, Noise characteristics of thermistors: Measurement methods and results of selected devices, Review of Scientific Instruments, 88, 2, 024707, (2017)

Share

COinS
 
Aug 23rd, 2:30 PM

Planar Detectors as Radiometric Standards using Carbon Nanotube Absorbers

Carbon nanotube technology, in conjunction with silicon micro-fabrication techniques, has enabled us to develop planar radiometric detectors, which is leading to the establishment of a new generation of primary standards at NIST. We will discuss the application of this technology to the development of this new generation of chip detectors [1,2]. The goal is to develop compact, fast, and easy-to-use calibration systems, spanning the wavelength spectrum from the ultraviolet to the THz region [3,4] in a single detector, suitable for use with both coherent and incoherent sources, and encompassing open beam and fibre-coupled modes of operation, with utility beyond that of the laboratory environment.

Recent work to enhance the absorptivity of nanotube arrays, using post-growth treatments, and the characterization of noise in temperature sensing thermistors will be presented [5].

Finally, work comparing scales, derived from two new table-top systems, to existing radiant power and optical fibre power scales traceable to SI will be presented.

1. N. A. Tomlin, M. White, I. Vayshenker, S. I. Woods, J. H. Lehman, Planar electrical substitution carbon nanotube cryogenic radiometer, Metrologia 52, 2, 376-383, (2015)

2. N. Tomlin, A. Curtin, M. White, J. Lehman, Decrease in reflectance of vertically-aligned carbon nanotubes after oxygen plasma treatment, Carbon, 74, 329-332, (2014)

3. A. Steiger, R. Mueller, A. Remesal Oliva, Y. Deng, Q. Sun, M.G. White, J.H. Lehman, Terahertz laser power measurement comparison, IEEE Transactions on Terahertz Science and Technology, 6, 5, 664-669, (2016)

4. J. Lehman, A. Steiger, N. Tomlin, M. White, M. Kehrt, I. Ryger, M. Stephens, C. Monte, I. Mueller, J. Hollandt, M. Dowell, Planar hyper-black absolute radiometer, Optics Express, 24, 23, 25911-25921, (2016)

5. I. Ryger, D. Harber, M. Stephens, M. White, N. Tomlin, M. Spidell, J. Lehman, Noise characteristics of thermistors: Measurement methods and results of selected devices, Review of Scientific Instruments, 88, 2, 024707, (2017)