Sensor calibration and characterization relies on models, measurements, and analysis to provide the needed data to derive results while estimating errors and uncertainties show how well the results are understood.

Session Chair: Dr. Eric Shirley, National Institute of Standards and Technology (NIST)

Schedule
2020
Sunday, September 20th
8:25 AM

Microwave Radiometer Instability Due to Infrequent Calibration

Kevin Coakley, National Institute of Standards and Technology (NIST)
Jolene Splett, National Institute of Standards and Technology (NIST)
David Walker, National Institute of Standards and Technology (NIST)
Mustafa Aksoy, University at Albany, State University of New York
Paul Racette, NASA Goddard Space Flight Center

8:25 AM