Date of Award:
5-2015
Document Type:
Thesis
Degree Name:
Master of Science (MS)
Department:
Electrical and Computer Engineering
Advisor/Chair:
Sanghamitra Roy
Abstract
Near-Threshold Computing embodies an intriguing choice for mobile processors due to the promise of superior energy efficiency, extending the battery life of these devices while reducing the peak power draw. However, process, voltage, and temperature variations cause a significantly high failure rate of Level One cache cells in the near-threshold regime a stark contrast to designs in the super-threshold regime, where fault sites are rare.
This thesis work shows that faulty cells in the near-threshold regime are highly clustered in certain regions of the cache. In addition, popular mobile benchmarks are studied to investigate the impact of run-time workloads on timing faults manifestation. A technique to mitigate the run-time faults is proposed. This scheme maps frequently used data to healthy cache regions by exploiting the application cache behaviors. The results show up to 78% gain in performance over two other state-of-the-art techniques.
Checksum
0a3ca24189c522ab53ad42d2cda00c78
Recommended Citation
Mugisha, Dieudonne Manzi, "Exploiting Application Behaviors for Resilient Static Random Access Memory Arrays in the Near-Threshold Computing Regime" (2015). All Graduate Theses and Dissertations. 4550.
https://digitalcommons.usu.edu/etd/4550
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